TLM fit

This example shows how to perform the curve-fitting via Quokka3 simulations required for the biTLM method. It thereby shows how to use the optimizer functionality of Quokka3, and how to simulate a resistance test structure.

It is well.known that for the case of full-area passivating contacts which are metallized only locally (e.g. industrial n-TOPCon cells or HJT cells), several contact resistances rather than only a single metal-semiconductor resistance matter.

HJT optics

This examples shows how to calibrate Quokka3's optical model, the extended Basore model, to measured reflection and EQE data of a HJT cell. In particular this results in the determination of the significant NIR parastic absorption loss in the a-Si and TCO layers using the Appp concept.

The investigated cell is a Fraunhofer ISE HJT cell. 

A paper on Appp including a detailed description of this example was submitted to SOLMAT.